• Home > 제품소개 > SEMICONDUCTOR Business > Wafer Tester > Resistivity Mapping
Non-destructive
Contamination and oxide monitoring
Resistivity profiling
SPC product wafer
Integrated FOUP and minienvironment
-
-
-
#403,Kunyoung Town,2006-1,Juckjeon-dong,Suji-gu,Yongin-si,Kyunggi-do,448-160,Korea Tel:82-31-889-8985(rep,) Fax:82-31-889-8987
Copyright(c) 2000 by Miru Tech all right reserved
