• Home > 제품소개 > Solar(Photovoltage) Business > Wafer Tester > Lifetime (μ-PCD)
non-contact, non-destructive high resolution
measurement
wafer and block measurement with the same machine
max,dimension of block
380(I) x 300(W) x 150(H) mm
limited by weight 20kg
can be combined with the SPV,LBIC,Rs and JPV
non-contact single-point measurement
1:1 correlation with the standard
WT-2000 Wafer Tester
measurement of mono-and multi-crystalline
material
measurement selectable at any position
on the wafer
#508,Gyeonggi R&DB Center,906-5,Iui-dong,Yeongtong-gu,Suwon,Gyeonggi-do,443-766,KOREA Tel:031-889-8985(rep,) Fax:031-889-8987
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