• Home > 제품소개 > Solar(Photovoltage) Business > Wafer Tester > LBIC
mapping of light beam induced current (LBIC) in
single- and multi- crystalline wafers
reflectance measurement with multiple wavelengths
for quantum efficiency determination
can be combined with the μ-PCD, Rs and JPV mapping
#508,Gyeonggi R&DB Center,906-5,Iui-dong,Yeongtong-gu,Suwon,Gyeonggi-do,443-766,KOREA Tel:031-889-8985(rep,) Fax:031-889-8987
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