• Home > 제품소개 > Solar(Photovoltage) Business > Wafer Tester > Resistivity Mapping
non-contact, non-destructive whole wafer resistivity
mapping base on the
eddy current technic for determination
of bulk resistivity in Si wafers
and blocks
resistivity range : 0.5 ~ 20 Ω cm
can be combined with the μ-PCD, LBIC and JPV
#508,Gyeonggi R&DB Center,906-5,Iui-dong,Yeongtong-gu,Suwon,Gyeonggi-do,443-766,KOREA Tel:031-889-8985(rep,) Fax:031-889-8987
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