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JPV (Junction Photo Voltage) technic
non-contact, non-destructive whole wafer sheet resistance mapping
measurement range: 10Ω/sq to 1000Ω/sq
samples : multi or single crystalline material (np or pn structure)
available 1:1 correlation with 4pp
can be combined with μ-PCD, LBIC and Rs mapping
 
 
 
#508,Gyeonggi R&DB Center,906-5,Iui-dong,Yeongtong-gu,Suwon,Gyeonggi-do,443-766,KOREA Tel:031-889-8985(rep,) Fax:031-889-8987
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